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Additional resources for A statistical test suite for random and pseudorandom number generators for cryptographic applications (SuDoc C 13.10:800-22)
Log 2 ( i " T j ) , where Tj is the table entry corresponding to i =Q +1 the decimal representation of the contents of the ith L-bit block. 1949875. 6 & f n ' expectedValue( L ) 2( % Compute P-value = erfc $$ # ! 3, and ! " expectedValue(L) and σ are taken from a table of precomputed values2 (see the table below). Under an assumption of randomness, the sample mean, expectedValue(L), is the theoretical expected value of the computed statistic for the given L-bit length. The theoretical standard deviation is given by !
The purpose of this test is to detect generators that produce too many occurrences of a given non-periodic (aperiodic) pattern. 8, an m-bit window is used to search for a specific m-bit pattern. If the pattern is not found, the window slides one bit position. If the pattern is found, the window is reset to the bit after the found pattern, and the search resumes. 2 Function Call NonOverlappingTemplateMatching(m,n) m The length in bits of each template. The template is the target string. n The length of the entire bit string under test.
538968. 05 )/ 2 & d # ! $ 2 !. 538968 # ! 123812. 01, then conclude that the sequence is non-random. Otherwise, conclude that the sequence is random. 123812), the conclusion is that the sequence is random. A d value that is too low would indicate that there were too few peaks (< 95%) below T, and too many peaks (more than 5%) above T. , n ≥ 1000). 01, accept the sequence as random. 1 Test Purpose The focus of this test is the number of occurrences of pre-specified target strings. The purpose of this test is to detect generators that produce too many occurrences of a given non-periodic (aperiodic) pattern.